Testing Challenges in the Highly Interconnected World of IoT | Bede Ngaruko

Event Details

Testing Challenges in the Highly Interconnected World of IoT | Bede Ngaruko

Time: July 3, 2017 from 8pm to 9pm
Location: online
Website or Map: http://bit.ly/2sipL1O
Event Type: online, masterclass
Organized By: Ministry of Testing
Latest Activity: on Sunday

Export to Outlook or iCal (.ics)

Event Description

Register for the free online Masterclass: 

https://dojo.ministryoftesting.com/events/testing-challenges-in-the-highly-interconnected-world-of-iot-bede-ngaruko

The Internet of Things is a growing trend in the software industry. With a combination of software and hardware/sensor devices, both individuals and enterprise consumers want to be able to monitor, activate and control their devices from the comfort of their homes and offices.

This is an interesting development and a powerful experience for users. But with great power comes great challenges. For a start, there is no GUI to test in some instances. Consumers of parts of an IoT system may be non-human; and wireless connections create more attack vectors, therefore more security challenges. To be up to the challenge, testers of IoT have a lot more to learn. 

In this masterclass, Bede will share his experiences testing IoT systems in Telematics, explore other applications of IoT, discuss the main challenges of testing IoT systems and the security vulnerabilities to be aware of.

Register for the free online Masterclass: 

https://dojo.ministryoftesting.com/events/testing-challenges-in-the-highly-interconnected-world-of-iot-bede-ngaruko

Comment Wall

Add a Comment

RSVP for Testing Challenges in the Highly Interconnected World of IoT | Bede Ngaruko to add comments!

Join Software Testing Club - An Online Software Testing Community

Attending (21)

Might attend (5)

Adverts

© 2017   Created by Rosie Sherry.   Powered by

Badges  |  Report an Issue  |  Terms of Service